1![Research Article www.acsami.org Water-Soluble Thin Film Transistors and Circuits Based on Amorphous Indium−Gallium−Zinc Oxide Sung Hun Jin,*,†,¶ Seung-Kyun Kang,⊥,¶ In-Tak Cho,§,¶ Sang Youn Han,⊥,# Ha Uk Ch Research Article www.acsami.org Water-Soluble Thin Film Transistors and Circuits Based on Amorphous Indium−Gallium−Zinc Oxide Sung Hun Jin,*,†,¶ Seung-Kyun Kang,⊥,¶ In-Tak Cho,§,¶ Sang Youn Han,⊥,# Ha Uk Ch](https://www.pdfsearch.io/img/90b6a1579c6b5d7faedbcdaf79c681df.jpg) | Add to Reading ListSource URL: rogers.matse.illinois.eduLanguage: English - Date: 2015-05-04 07:20:04
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2![MAIN DISPLAY Mobile Display Driver IC Solomon Systech offers a series of single-chip TFT LCD Driver ICs to support TFT display panels of a wide range of resolutions from QVGA to QHD, which are ideal for smartphone appli MAIN DISPLAY Mobile Display Driver IC Solomon Systech offers a series of single-chip TFT LCD Driver ICs to support TFT display panels of a wide range of resolutions from QVGA to QHD, which are ideal for smartphone appli](https://www.pdfsearch.io/img/7225980fdf40c91d3fc719fc679c0012.jpg) | Add to Reading ListSource URL: www.solomon-systech.com.cnLanguage: English - Date: 2016-05-04 23:06:31
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3![KAUST Repository High Electron Mobility Thin-Film Transistors Based on Solution-Processed Semiconducting Metal Oxide Heterojunctions and Quasi-Superlattices KAUST Repository High Electron Mobility Thin-Film Transistors Based on Solution-Processed Semiconducting Metal Oxide Heterojunctions and Quasi-Superlattices](https://www.pdfsearch.io/img/1a213ab1136b1fdb4a12ccbfffbee503.jpg) | Add to Reading ListSource URL: repository.kaust.edu.saLanguage: English - Date: 2015-05-31 04:48:59
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4![T ECH HIGHLIGH T S Chloride Ion Interaction with Oxide-Covered Aluminum Leading to Pitting Corrosion Corrosion would be a much more common phenomenon were it not for the passive T ECH HIGHLIGH T S Chloride Ion Interaction with Oxide-Covered Aluminum Leading to Pitting Corrosion Corrosion would be a much more common phenomenon were it not for the passive](https://www.pdfsearch.io/img/b8154cedf5945320f8ce63a37556bbea.jpg) | Add to Reading ListSource URL: www.electrochem.orgLanguage: English - Date: 2015-01-05 15:18:14
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5![AMDp2 - 5 High-Performance and Low-Temperature-Compatible Solid Phase Crystallized Polycrystalline Silicon Thin Film Transistors Using Thermal Oxide Buffered Aluminum Oxide as Gate Dielectric AMDp2 - 5 High-Performance and Low-Temperature-Compatible Solid Phase Crystallized Polycrystalline Silicon Thin Film Transistors Using Thermal Oxide Buffered Aluminum Oxide as Gate Dielectric](https://www.pdfsearch.io/img/b4cc93cfa8f80350a3d0a11fbd64e0bc.jpg) | Add to Reading ListSource URL: www.pskl.ust.hkLanguage: English - Date: 2014-10-10 03:11:48
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6![IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 59, NO. 2, FEBRUARY[removed]Zinc-Oxide Thin-Film Transistor With Self-Aligned Source/Drain Regions Doped With Implanted IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 59, NO. 2, FEBRUARY[removed]Zinc-Oxide Thin-Film Transistor With Self-Aligned Source/Drain Regions Doped With Implanted](https://www.pdfsearch.io/img/6d3933bd69916bc8f8b66e453f0a8311.jpg) | Add to Reading ListSource URL: www.pskl.ust.hkLanguage: English - Date: 2014-10-10 02:44:38
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7![P-22: Top-Gate Thin Film Transistor with ZnO:N Channel Fabricated by Room Temperature RF Magnetron Sputtering P-22: Top-Gate Thin Film Transistor with ZnO:N Channel Fabricated by Room Temperature RF Magnetron Sputtering](https://www.pdfsearch.io/img/e18aee0e0f1cf659dceaeeebd39633a7.jpg) | Add to Reading ListSource URL: www.pskl.ust.hkLanguage: English - Date: 2014-10-10 03:11:50
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8![IEEE ELECTRON DEVICE LETTERS, VOL. 35, NO. 8, AUGUST[removed]A Comparative Study on the Effects of Annealing on the Characteristics of Zinc Oxide Thin-Film IEEE ELECTRON DEVICE LETTERS, VOL. 35, NO. 8, AUGUST[removed]A Comparative Study on the Effects of Annealing on the Characteristics of Zinc Oxide Thin-Film](https://www.pdfsearch.io/img/94c75b5fed217fc109112d8d6d032b1c.jpg) | Add to Reading ListSource URL: www.pskl.ust.hkLanguage: English - Date: 2014-10-10 02:44:38
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9![TF.1 Evaluation of Self-Heating and Hot Carrier Degradation of Poly-Si Thin-Film Transistors Using Charge Pumping Technique TF.1 Evaluation of Self-Heating and Hot Carrier Degradation of Poly-Si Thin-Film Transistors Using Charge Pumping Technique](https://www.pdfsearch.io/img/878c4b1d0c5d2dcb4797eb53b93a75e6.jpg) | Add to Reading ListSource URL: www.pskl.ust.hkLanguage: English - Date: 2014-10-10 02:44:39
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10![Thin Solid Films[removed]–400 Contents lists available at ScienceDirect Thin Solid Films journal homepage: www.elsevier.com/locate/tsf Thin Solid Films[removed]–400 Contents lists available at ScienceDirect Thin Solid Films journal homepage: www.elsevier.com/locate/tsf](https://www.pdfsearch.io/img/4bc3839759edb16862eba530a84a91ab.jpg) | Add to Reading ListSource URL: www.pskl.ust.hkLanguage: English - Date: 2014-10-09 23:15:50
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